Wafer-Level Characterization of Probecards using NAC Probing. - Gyu-Yeol Kim; Eon-Jo Byunb; Ki-Sang Kang; Young-Hyun Jun; Bai-Sun Kong (ITC, 2008)

Novel TDR Test Method for Diagnosis of Interconnect Failures Using Automatic Test Equipment. - Gyu-Yeol Kim; Shin-Ho Kang; Wansoo Nah (IEEE Trans. Instrum. Meas., 2017)

ADAM Optimization with Adaptive Batch Selection. - Gyu-Yeol Kim; Min-hwan Oh (ICLR, 2025)