All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits. - Gyusung Park; Minsu Kim; Chris H. Kim; Bongjin Kim; Vijay Reddy (IRPS, 2018)

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. - Gyusung Park; Minsu Kim; Nakul Pande; Po-Wei Chiu; Jeehwan Song; Chris H. Kim (CICC, 2019)

Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. - Nakul Pande; Gyusung Park; Chris H. Kim; Srikanth Krishnan; Vijay Reddy (IRPS, 2019)

Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. - Hanzhao Yu; Gyusung Park; Chris H. Kim (ESSCIRC, 2021)

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. - Gyusung Park; Hanzhao Yu; Minsu Kim; Chris H. Kim (IRPS, 2021)

15.2 A 2048x60m4 SRAM Design in Intel 4 with an Around-the-Array Power-Delivery Scheme Using PowerVia. - Daeyeon Kim; Yusung Kim 002; Ayush Shrivastava; Gyusung Park; Anandkumar Mahadevan Pillai; Kunal Bannore; Tri Doan; Muktadir Rahman; Gwanghyeon Baek; Clifford Ong; Xiaofei Wang; Zheng Guo; et al. (ISSCC, 2024)

29.2 A 0.021µm2 High-Density SRAM in Intel-18A-RibbonFET Technology with PowerVia-Backside Power Delivery. - Xiaofei Wang; Yusung Kim 002; Gwanghyeon Baek; Kunal Girish Bannore; Kaushal Dave; Arash Joushaghani; Narae Kang; Minwoo Ko; Anandkumar Mahadevan Pillai; Hema Chandra Prakash Movva; Gyusung Park; Muktadir Rahman; et al. (ISSCC, 2025)