Early identification of ineffective cooperative learning teams. - C. M. Hsiung; L. F. Luo; H. C. Chung (J. Comput. Assist. Learn., 2014)

Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology. - C. A. Lu; H. P. Lee; H. C. Chen; Y. C. Lin; Y. H. Chung; S. H. Wang; J. Y. Yeh; V. S. Chang; M. C. Chiang; W. Chang; H. C. Chung; C. F. Cheng; et al. (VLSI Technology and Circuits, 2023)