Automatic Test Pattern Generation with Optimal Load Balancing. - H.-Ch. Dahmen; Uwe Gläser; Heinrich Theodor Vierhaus (PVM, 1996)

An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. - H.-Ch. Dahmen; Uwe Gläser; Heinrich Theodor Vierhaus (Great Lakes Symposium on VLSI, 1997)

A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. - H.-Ch. Dahmen; Uwe Gläser; Heinrich Theodor Vierhaus (PARCO, 1997)

The Impact of Area Optimization for the Power Consumption of Controllers. - H.-Ch. Dahmen; Uwe Gläser (EUROMICRO, 1998)

Modell Evaluation Using Genetic Manipulation Techniques. - H.-Ch. Dahmen; Uwe Gläser; Zoran Stamenkovic (Great Lakes Symposium on VLSI, 1999)