Fast Automatic Failbit Analysis for DRAMs. - W. Malzfeldt; W. Mohr; H.-D. Oberle; K. Kodalle (ITC, 1989)

Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. - H.-D. Oberle; Peter Muhmenthaler (ITC, 1991)

Enhanced fault modeling for DRAM test and analysis. - H.-D. Oberle; M. Maue; Peter Muhmenthaler (VTS, 1991)