Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size. - Robert S. Howell; Randall Lewis; H. George Henry; Harold Hearne; Deas Brown; Dale Dawson; Andris Ezis (Microelectron. Reliab., 2014)

Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs. - Akhil S. Kumar; Michael J. Uren; Matthew D. Smith 003; Martin Kuball; Justin Parke; H. George Henry; Robert S. Howell (IRPS, 2023)