First Fire-free, Low-voltage ( 1.2 V), and Low Off-current ( 3 nA) SiOxTey Selectors. - S. Vaziri; I. M. Datye; Elia Ambrosi; Asir Intisar Khan; H. Kwon; C. H. Wu; C. F. Hsu; J. Guy; T. Y. Lee; H.-S. Philip Wong; X. Y. Bao (VLSI Technology and Circuits, 2022)

Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. - Hideo Sato; H. M. Shin; H. Jung; S. W. Lee; H. Bae; H. Kwon; K. H. Ryu; W. C. Lim; Y. S. Han; J. H. Jeong; J. M. Lee; D. S. Kim; et al. (IRPS, 2023)

Multiscale Modeling and Calibration of Hot-Carrier Stress Degradation in SiGe DRAM Peripheral MOSFETs. - L. Silvestri; S. Jin; W. Jeong; H. Shim; W. Yim; H. Kwon; D. Oh; S. Son; N. Zographos; N. Kim; X.-W. Lin; L. Sponton; et al. (IRPS, 2025)