Dynamic study of the thermal laser stimulation response on advanced technology structures. - Antoine Reverdy; M. de la Bardonnie; Patrick Poirier; H. Murray; Philippe Perdu; A. Boukkali (Microelectron. Reliab., 2008)

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. - Antoine Reverdy; Philippe Perdu; H. Murray; M. de la Bardonnie; Patrick Poirier (Microelectron. Reliab., 2008)

Determination of temperature change inside IC packages during laser ablation of molding compound. - P. Schwindenhammer; H. Murray; Philippe Descamps; Patrick Poirier (Microelectron. Reliab., 2008)