Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters. - Peter Lagger; S. Donsa; P. Spreitzer; Gregor Pobegen; M. Reiner; H. Naharashi; J. Mohamed; H. Mosslacher; G. Prechtl; Dionyz Pogany; Clemens Ostermaier (IRPS, 2015)