Influence of post-annealing on the mechanical and electrical properties of boron-doped nanocrystalline silicon thin films. - J. N. Ding; H. S. Qi; N. Y. Yuan; Y. L. He; G. G. Cheng (NEMS, 2009)

A fuzzy criticality assessment system of process equipment for optimised maintenance management. - H. S. Qi; R. N. Alzaabi; Alastair S. Wood; M. Jani (Int. J. Comput. Integr. Manuf., 2015)