Design and development of 130-nanometer ICs for a multi-Gigabit switching network system. - Aurangzeb Khan; K. Ruparel; C. Joly; V. Ghanta; Due Le; T. Nguyen; J. Yu; Steven Yang; Irfan Ahmed; N. Burnside; V. Chagarlamudi; M. Cheung; et al. (CICC, 2004)

Device reliability for CMOS image sensors with backside through-silicon vias. - Jeff Peter Gambino; H. Soleimani; I. Rahim; B. Riebeek; L. Sheng; G. Hosey; H. Truong; Gavin D. R. Hall; R. Jerome; D. Price (IRPS, 2018)

Verifying Device Drivers with Pancake. - Junming Zhao; Alessandro Legnani; Tiana J. Tsang Ung; H. Truong; Tsun Wang Sau; Miki Tanaka; Johannes Åman Pohjola; Thomas Sewell; Robert Sison; Syeda Hira; Magnus Myreen; Michael Norrish; et al. (CoRR, 2025)