BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing. - H. W. Wan; Y. J. Hong; Y. T. Cheng; M. Hong (IRPS, 2019)

Fundamental Understanding of Oxide Defects in HfO2 and Y2O3 on GaAs(001) with High Thermal Stability. - H. W. Wan; Y. J. Hong; L. B. Young; M. Hong; J. Kwo (IRPS, 2019)