High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. - Fahim Hami; Habib Boulzazen; Moncef Kadi (I2MTC, 2015)

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. - Shawki Douzi; Moncef Kadi; Habib Boulzazen; Mohamed Tlig; Jaleleddine Ben Hadj Slama (Microelectron. Reliab., 2018)