Transistor-to-GDS Reliability Analysis in Sub-3nm: Impact of Self-Heating and Aging on Timing. - Swati Deshwal; Hadi Nour Eddine; Mahdi Benkhelifa; Albi Mema; Yogesh Singh Chauhan; Hussam Amrouch (ISLPED, 2025)

Power Side-Channel Attacks in Nanosheet Circuits. - Mohammed Nabeel 001; Hadi Nour Eddine; Mahdi Benkhelifa; Ozgur Sinanoglu; Michail Maniatakos; Johann Knechtel; Hussam Amrouch (ISCAS, 2026)