Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test. - Se Young Kim; Hahyeon Park; Hongbum Kim; Joon Kim; Kyoungwon Seo (Inf. Process. Manag., 2022)

Corrigendum to 'Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test'; Information Processing & Management 59 (2022) 103093 /6. - Se Young Kim; Hahyeon Park; Hongbum Kim; Joon Kim; Kyoungwon Seo (Inf. Process. Manag., 2023)