Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit. - Hai Jiang 005; Hyun-Chul Sagong; Jinju Kim; Junekyun Park; Sangchul Shin; Sangwoo Pae (IRPS, 2019)

Aging-Aware Design Verification Methods Under Real Product Operating Conditions. - Hyewon Shim; Jeongmin Jo; Yoohwan Kim; Bongyong Jeong; Minji Shon; Hai Jiang 005; Sangwoo Pae (IRPS, 2019)

Reliability on EUV Interconnect Technology for 7nm and beyond. - Tae-Young Jeong; Miji Lee; Yunkyung Jo; Jinwoo Kim; Min Kim; Myungsoo Yeo; Jinseok Kim 005; Hyunjun Choi; Joosung Kim; Yoojin Jo; Yongsung Ji; Taiki Uemura; et al. (IRPS, 2020)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology. - Hai Jiang 005; Hyun-Chul Sagong; Jinju Kim; Hyewon Shim; Yoohwan Kim; Junekyun Park; Taiki Uemura; Yongsung Ji; Taeyoung Jeong; Dongkyun Kwon; Hwasung Rhee; Sangwoo Pae; et al. (IRPS, 2020)

Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology. - Heung-Kook Ko; Sena Park; Jihyun Ryu; Sung Ryul Kim; Giwon Lee; Dongjoon Lee; Sangwoo Pae; Euncheol Lee; Yongsun Ji; Hai Jiang 005; Taeyoung Jeong; Taiki Uemura; et al. (IRPS, 2020)

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; Euncheol Lee; Jaehee Choi; et al. (IRPS, 2020)

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET. - Taiki Uemura; Byungjin Chung; Jeongmin Jo; Hai Jiang 005; Yongsung Ji; Tae-Young Jeong; Rakesh Ranjan; Youngin Park; Kiil Hong; Seungbae Lee; Hwasung Rhee; Sangwoo Pae; et al. (IRPS, 2020)

Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. - Hai Jiang 005; Jinju Kim; Kihyun Choi; Hyewon Shim; Hyunchul Sagong; Junekyun Park; Hwasung Rhee; Euncheol Lee (IRPS, 2021)