MM-GRADE: A Multi-Modal EDA Tool Documentation QA Framework Leveraging Retrieval Augmented Generation. - Yuan Pu 001; Zhuolun He; Shutong Lin; Jiajun Qin; Xinyun Zhang; Hairuo Han; Haisheng Zheng; Yuqi Jiang; Cheng Zhuo; Qi Sun 002; David Z. Pan; Bei Yu 001 (ICCAD, 2025)