A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs. - Rami F. Salem; Abdelrahman ElMously; Haitham Eissa; Mohamed Dessouky; Mohab H. Anis (IDT, 2010)

An automated design methodology for stress avoidance in analog & mixed signal designs. - Romany Sameer; Ahmed Nader Mohieldin; Haitham Eissa (IDT, 2010)

An electrical-aware parametric DFM solution for analog circuits. - Rami Fathy Salem; Ahmed Arafa; Sherif Hany; Abdelrahman ElMously; Haitham Eissa; Mohamed Dessouky; David Nairn; Mohab H. Anis (IDT, 2011)

A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. - Rami F. Salem; Ahmed Arafa; Sherif Hany; Abdelrahman ElMously; Haitham Eissa; Mohamed Dessouky; David Nairn; Mohab H. Anis (SoCC, 2011)

Layout stress and proximity aware analog design methodology. - Ahmed Zein; Amr Tarek; Mohamed Bahr; Mohamed Dessouky; Haitham Eissa; Ahmed Ramadan; Amr Tosson (ICECS, 2012)

High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. - Rami F. Salem; Mohamed Al-Imam; Abdelrahman ElMously; Haitham Eissa; Ahmed Arafa; Mohab H. Anis (ISQED, 2012)

Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow. - Haitham Eissa; Rami Fathy Salem; Ahmed Arafa; Sherif Hany; Abdelrahman ElMously; Mohamed Dessouky; David Nairn; Mohab H. Anis (IEEE Trans. Very Large Scale Integr. Syst., 2013)