Making predictive analog/RF alternate test strategy independent of training set size. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Olivier Potin; Michel Renovell (ITC, 2012)

Smart selection of indirect parameters for DC-based alternate RF IC testing. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Michel Renovell; Vincent Kerzerho; Olivier Potin; Christophe Kelma (VTS, 2012)

Implementing model redundancy in predictive alternate test to improve test confidence. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Olivier Potin; Michel Renovell (ETS, 2013)

New implementions of predictive alternate analog/RF test with augmented model redundancy. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Michel Renovell (DATE, 2014)

Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability. - Hassen Aziza; Haithem Ayari; Santhosh Onkaraiah; Jean-Michel Portal; Mathieu Moreau; Marc Bocquet (DFT, 2014)

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. - Haithem Ayari; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Michel Renovell (Microelectron. J., 2014)

Multilevel operation in oxide based resistive RAM with SET voltage modulation. - Hassen Aziza; Haithem Ayari; Santhosh Onkaraiah; Mathieu Moreau; Jean-Michel Portal; Marc Bocquet (DTIS, 2016)