Testing for Resistive Shorts in FPGA Interconnects. - Haixia Gao; Yintang Yang; Xiaohua Ma 001; Gang Dong (ISQED, 2005)

Analysis of the Effect of LUT Size on FPGA Area and Delay Using Theoretical Derivations. - Haixia Gao; Yintang Yang; Xiaohua Ma 001; Gang Dong (ISQED, 2005)

Relationship of trustworthiness and relational benefit in electronic catalog markets. - Haixia Gao; Dawei Liu 002 (Electron. Mark., 2014)