A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability. - Haksong Kim; Yong Lee 002; Sungho Kang 001 (IEEE Trans. Reliab., 2015)

A 1.1V 1ynm 6.4Gb/s/pin 16Gb DDR5 SDRAM with a Phase-Rotator-Based DLL, High-Speed SerDes and RX/TX Equalization Scheme. - Dongkyun Kim; Minsu Park; Sungchun Jang; Jun-Yong Song; Hankyu Chi; Geunho Choi; Sunmyung Choi; Jaeil Kim; Changhyun Kim; Kyung Whan Kim; Kibong Koo; Seonghwi Song; et al. (ISSCC, 2019)