A Practical Approach to Static Signal Electromigration Analysis. - N. S. Nagaraj; Frank Cano; Haldun Haznedar; Duane Young (DAC, 1998)

A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. - Chanhee Oh; Haldun Haznedar; Martin Gall; Amir Grinshpon; Vladimir Zolotov; Pon Sung Ku; Rajendran Panda (ISQED, 2004)

Impact of stress-induced backflow on full-chip electromigration risk assessment. - Haldun Haznedar; Martin Gall; Vladimir Zolotov; Pon Sung Ku; Chanhee Oh; Rajendran Panda (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)