A high performance reconfigurable Motion Estimation hardware architecture. - Ozgur Tasdizen; Halil Kukner; Abdulkadir Akin; Ilker Hamzaoglu (DATE, 2009)

Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation. - Ozgur Tasdizen; Abdulkadir Akin; Halil Kukner; Ilker Hamzaoglu (IEEE Trans. Consumer Electron., 2009)

Generic, orthogonal and low-cost March Element based memory BIST. - Ad J. van de Goor; Said Hamdioui; Halil Kukner (ITC, 2011)

BTI impact on logical gates in nano-scale CMOS technology. - Seyab Khan; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (DDECS, 2012)

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. - Seyab Khan; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (DFT, 2012)

Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. - Halil Kukner; Pieter Weckx; Praveen Raghavan; Ben Kaczer; Francky Catthoor; Liesbet Van der Perre; Rudy Lauwereins; Guido Groeseneken (DSD, 2012)

Bias temperature instability analysis in SRAM decoder. - Seyab Khan; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (ETS, 2013)

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. - Seyab Khan; Mottaqiallah Taouil; Said Hamdioui; Halil Kukner; Praveen Raghavan; Francky Catthoor (IDT, 2013)

Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model. - Halil Kükner; Pieter Weckx; Praveen Raghavan; Ben Kaczer; Francky Catthoor; Liesbet Van der Perre; Rudy Lauwereins; Guido Groeseneken (Microprocess. Microsystems, 2013)

Bias Temperature Instability analysis of FinFET based SRAM cells. - Seyab Khan; Innocent Agbo; Said Hamdioui; Halil Kukner; Ben Kaczer; Praveen Raghavan; Francky Catthoor (DATE, 2014)

NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes. - Halil Kukner; Pieter Weckx; Sebastien Morrison; Praveen Raghavan; Ben Kaczer; Francky Catthoor; Liesbet Van der Perre; Rudy Lauwereins; Guido Groeseneken (DSD, 2014)

Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories. - Matthias Hartmann; Halil Kükner; Prashant Agrawal; Praveen Raghavan; Liesbet Van der Perre; Wim Dehaene (ACM Great Lakes Symposium on VLSI, 2014)

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology. - Halil Kukner; Moustafa A. Khatib; Sebastien Morrison; Pieter Weckx; Praveen Raghavan; Ben Kaczer; Francky Catthoor; Liesbet Van der Perre; Rudy Lauwereins; Guido Groeseneken (ISQED, 2014)

The defect-centric perspective of device and circuit reliability - From individual defects to circuits. - Ben Kaczer; Jacopo Franco; Pieter Weckx; Philippe Roussel; Erik Bury; Moonju Cho; Robin Degraeve; Dimitri Linten; Guido Groeseneken; Halil Kukner; Praveen Raghavan; Francky Catthoor; et al. (ESSDERC, 2015)

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. - Innocent Agbo; Mottaqiallah Taouil; Said Hamdioui; Halil Kukner; Pieter Weckx; Praveen Raghavan; Francky Catthoor (VTS, 2015)

Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes. - Halil Kükner; Pieter Weckx; Sébastien Morrison; Jacopo Franco; Maria Toledano-Luque; Moonju Cho; Praveen Raghavan; Ben Kaczer; Doyoung Jang; Kenichi Miyaguchi; Marie Garcia Bardon; Francky Catthoor; et al. (Microprocess. Microsystems, 2015)

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. - Innocent Agbo; Mottaqiallah Taouil; Daniel Kraak; Said Hamdioui; Halil Kukner; Pieter Weckx; Praveen Raghavan; Francky Catthoor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

RISC-V Processor Trace Encoder with Multiple Instructions Retirement Support. - Halil Kükner; Gökhan Kaplayan; Ahmet Efe; Mehmet Ali Gülden (VLSI-SoC, 2022)

Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation. - Subrat Mishra; Bjorn Vermeersch; Sankatali Venkateswarlu; Halil Kukner; A. Sharma; G. Mirabeli; Fabian M. Bufler; Moritz Brunion; Dawit Burusie Abdi; Herman Oprins; Dwaipayan Biswas; Odysseas Zografos; et al. (IRPS, 2024)

Thermal Considerations for Block-Level PPA Assessment in Angstrom Era: A Comparison Study of Nanosheet FETs (A10) & Complementary FETs (A5). - S. Mishra; Bjorn Vermeersch; Sankatali Venkateswarlu; Halil Kukner; Gioele Mirabelli; Fabian M. Bufler; Moritz Brunion; Dawit Burusie Abdi; Herman Oprins; Dwaipayan Biswas; Odysseas Zografos; Francky Catthoor; et al. (VLSI Technology and Circuits, 2024)

Backside Power Delivery in High Density and High Performance Context: IR-Drop and Block-Level Power-Performance-Area Benefits. - Yun Zhou; S. C. Song; Halil Kükner; Giuliano Sisto; Sheng Yang; Anita Farokhnejad; Mohamed Naeim; Moritz Brunion; Ji-Yung Lin; Odysseas Zografos; Pieter Weckx; Shashank Ekbote; et al. (VLSI Technology and Circuits, 2024)