A Linear Program Driven Scheduling and Allocation Method Followed by an Interconnect Optimization Algorithm. - Christos A. Papachristou; Haluk Konuk (DAC, 1990)

Explorations of sequential ATPG using Boolean satisfiability. - Haluk Konuk; Tracy Larrabee (VTS, 1993)

Fastpath: A Path-Delay Test Generator for Standard Scan Designs. - Bill Underwood; Wai-On Law; Sungho Kang; Haluk Konuk (ITC, 1994)

Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks. - Haluk Konuk; F. Joel Ferguson; Tracy Larrabee (DAC, 1995)

An unexpected factor in testing for CMOS opens: the die surface. - Haluk Konuk; F. Joel Ferguson (VTS, 1996)

Charge-based fault simulation for CMOS network breaks. - Haluk Konuk; F. Joel Ferguson; Tracy Larrabee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996)

Fault simulation of interconnect opens in digital CMOS circuits. - Haluk Konuk (ICCAD, 1997)

Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits. - Haluk Konuk; F. Joel Ferguson (ITC, 1997)

Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits. - Haluk Konuk; F. Joel Ferguson (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)

Voltage- and current-based fault simulation for interconnect open defects. - Haluk Konuk (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

On invalidation mechanisms for non-robust delay tests. - Haluk Konuk (ITC, 2000)

Validation and Test of Network Processors and ASICs. - C.-H. Chia; Sujit Dey; Faraydon Karim; Haluk Konuk; Keesup Kim (VTS, 2002)

DFFT : Design For Functional Testability. - Haluk Konuk; Leon Xiao (ITC, 2003)

Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing. - Haluk Konuk (VTS, 2009)

DFT and Test Problems from the Trenches. - Haluk Konuk (VTS, 2009)

Innovative practices session 6C: Latest practices in test compression. - Jonathon E. Colburn; Kun Young Chung; Haluk Konuk; Y. Dong (VTS, 2013)

Design for low test pattern counts. - Haluk Konuk; Elham K. Moghaddam; Nilanjan Mukherjee 001; Janusz Rajski; Deepak Solanki; Jerzy Tyszer; Justyna Zawada (DAC, 2015)