Fault Simulation for VHDL Based Test Bench and BIST Evaluation. - Hamed Farshbaf; Mina Zolfy; Shahrzad Mirkhani; Zainalabedin Navabi (Asian Test Symposium, 2001)

Scalable closed-boundary analog neural networks. - Sied Mehdi Fakhraie; Hamed Farshbaf; Kenneth Carless Smith (IEEE Trans. Neural Networks, 2004)