A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis. - Yacoub M. El-Ziq; Hamid H. Butt (ITC, 1983)

Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. - Yacoub M. El-Ziq; Hamid H. Butt (ITC, 1984)