Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. - Hamid Toutah; Jean-François Llibre; Boubekeur Tala-Ighil; Taieb Mohammed-Brahim; Youri Helen; G. Gautier; Olivier Bonnaud (Microelectron. Reliab., 2001)

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. - Hamid Toutah; Boubekeur Tala-Ighil; Jean-François Llibre; Bertrand Boudart; Taieb Mohammed-Brahim; Olivier Bonnaud (Microelectron. Reliab., 2003)

Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. - Cheick Oumar Maïga; Hamid Toutah; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2004)

Trench insulated gate bipolar transistors submitted to high temperature bias stress. - Cheick Oumar Maïga; Hamid Toutah; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2005)