An M/M/c queue model for hub covering location problem. - Mehrdad Mohammadi; Fariborz Jolai; Hamideh Rostami (Math. Comput. Model., 2011)

Equipment Condition Diagnosis and Fault Fingerprint Extraction in Semiconductor Manufacturing. - Hamideh Rostami; Jakey Blue; Claude Yugma (ICMLA, 2016)

Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing. - Hamideh Rostami; Jakey Blue; Argon Chen; Claude Yugma (CASE, 2018)

Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data. - Hamideh Rostami; Jakey Blue; Claude Yugma (Appl. Soft Comput., 2018)

Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing. - Hamideh Rostami; Jakey Blue; Argon Chen; Claude Yugma (Int. J. Intell. Syst., 2021)