A Test-Vector Generation Methodology for Crosstalk Noise Faults. - Hamidreza Hashempour; Yong-Bin Kim; Nohpill Park (DFT, 2002)

Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi (DFT, 2002)

ATE-Amenable Test Data Compression with No Cyclic Scan. - Hamidreza Hashempour; Fabrizio Lombardi (DFT, 2003)

Hybrid Multisite Testing at Manufacturing. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi; Farzin Karimi (ITC, 2003)

Compression of VLSI Test Data by Arithmetic Coding. - Hamidreza Hashempour; Fabrizio Lombardi (DFT, 2004)

Error-Resilient Test Data Compression Using Tunstall Codes. - Hamidreza Hashempour; Luca Schiano; Fabrizio Lombardi (DFT, 2004)

Evaluation of heuristic techniques for test vector ordering. - Hamidreza Hashempour; Fabrizio Lombardi (ACM Great Lakes Symposium on VLSI, 2004)

Analysis and measurement of fault coverage in a combined ATE and BIST environment. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2004)

Evaluation of Error-Resilience for Reliable Compression of Test Data. - Hamidreza Hashempour; Luca Schiano; Fabrizio Lombardi (DATE, 2005)

Two dimensional reordering of functional test data for compression by ATE. - Hamidreza Hashempour; Fabrizio Lombardi (ACM Great Lakes Symposium on VLSI, 2005)

Enhancing error resilience for reliable compression of VLSI test data. - Hamidreza Hashempour; Luca Schiano; Fabrizio Lombardi (ACM Great Lakes Symposium on VLSI, 2005)

Improving Error Resilience for Compressed Test Sets by Don't Care Assignment. - Hamidreza Hashempour; Fabrizio Lombardi (SoCC, 2005)

Application of Arithmetic Coding to Compression of VLSI Test Data. - Hamidreza Hashempour; Fabrizio Lombardi (IEEE Trans. Computers, 2005)

Analysis and evaluation of multisite testing for VLSI. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2005)

Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data. - Hamidreza Hashempour; Luca Schiano; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2005)

A Novel Methodology for Functional Test Data Compression. - Hamidreza Hashempour; Fabrizio Lombardi (DFT, 2006)

Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. - Hamidreza Hashempour; Fabrizio Lombardi (DATE, 2007)

On the Error Effects of Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. - Marco Ottavi; Hamidreza Hashempour; Vamsi Vankamamidi; Faizal Karim; Konrad Walus; André Ivanov (DFT, 2007)

An Integrated Environment for Design Verification of ATE Systems. - Hamidreza Hashempour; Fabrizio Lombardi; Warren Necoechea; Rakesh Mehta; Tim Alton (IEEE Trans. Instrum. Meas., 2007)

Device Model for Ballistic CNFETs Using the First Conducting Band. - Hamidreza Hashempour; Fabrizio Lombardi (IEEE Des. Test Comput., 2008)

Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets. - Hamidreza Hashempour; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2008)

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. - Friedrich Hapke; Rene Krenz-Baath; Andreas Glowatz; Jürgen Schlöffel; Hamidreza Hashempour; Stefan Eichenberger; Camelia Hora; Dan Adolfsson (ITC, 2009)

Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. - Faizal Karim; Marco Ottavi; Hamidreza Hashempour; Vamsi Vankamamidi; Konrad Walus; André Ivanov; Fabrizio Lombardi (J. Electron. Test., 2009)

Defect-oriented cell-internal testing. - Friedrich Hapke; Wilfried Redemund; Jürgen Schlöffel; Rene Krenz-Baath; Andreas Glowatz; Michael Wittke; Hamidreza Hashempour; Stefan Eichenberger (ITC, 2010)

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. - Hamidreza Hashempour; Jos Dohmen; Bratislav Tasic; Bram Kruseman; Camelia Hora; Maikel van Beurden; Yizi Xing (DATE, 2011)

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. - Nivesh Rai; Hamidreza Hashempour; Yizi Xing; Bram Kruseman; Said Hamdioui (DFT, 2011)

Defect Oriented Testing for analog/mixed-signal devices. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (ITC, 2011)

Defect Oriented Testing for Analog/Mixed-Signal Designs. - Bram Kruseman; Bratislav Tasic; Camelia Hora; Jos Dohmen; Hamidreza Hashempour; Maikel van Beurden; Yizi Xing (IEEE Des. Test Comput., 2012)

A data-set of piercing needle through deformable objects for Deep Learning from Demonstrations. - Hamidreza Hashempour; Kiyanoush Nazari; Fangxun Zhong; Amir Ghalamzan E (CoRR, 2020)

Deep-LfD: Deep robot learning from demonstrations. - Amir Ghalamzan E; Kiyanoush Nazari; Hamidreza Hashempour; Fangxun Zhong (Softw. Impacts, 2021)

Secure SWIPT in STAR-RIS Aided Downlink MISO Rate-Splitting Multiple Access Networks. - Hamidreza Hashempour; Hamed Bastami; Majid Moradikia; Seyed A. Zekavat; Hamid Behroozi; A. Lee Swindlehurst (CoRR, 2022)