MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation. - Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Han Speek; Nur Engin (ICECS, 1996)

Integrated Design and Test of Mixed-Signal Circuits. - Nur Engin; Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Han Speek (J. Electron. Test., 1999)

Bridging the testing speed gap: design for delay testability. - Han Speek; Hans G. Kerkhoff; Manoj Sachdev; Mansour Shashaani (ETW, 2000)

Design for Delay Testability in High-Speed Digital ICs. - Hans G. Kerkhoff; Han Speek; M. Shashani; Manoj Sachdev (J. Electron. Test., 2001)