A New Weight Set Generation Algorithm for Weighted Random Pattern Generation. - Hangkyu Lee; Sungho Kang (ICCD, 1999)

Scan BIST Targeting Transition Faults Using a Markov Source. - Hangkyu Lee; Irith Pomeranz; Sudhakar M. Reddy (ISQED, 2004)

Selecting High-Quality Delay Tests for Manufacturing Test and Debug. - Hangkyu Lee; Suriyaprakash Natarajan; Srinivas Patil; Irith Pomeranz (DFT, 2006)

A Test Generation Procedure for Avoiding the Detection of Functionally Redundant Transition Faults. - Hangkyu Lee; Irith Pomeranz; Sudhakar M. Reddy (VTS, 2006)

On Complete Functional Broadside Tests for Transition Faults. - Hangkyu Lee; Irith Pomeranz; Sudhakar M. Reddy (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)