Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection. - Zahra Paria Najafi-Haghi; Florian Klemme; Hanieh Jafarzadeh; Hussam Amrouch; Hans-Joachim Wunderlich (DATE, 2023)

Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm. - Natalia Lylina; Stefan Holst; Hanieh Jafarzadeh; Alexandra Kourfali; Hans-Joachim Wunderlich (DSN-W, 2023)

Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay Optimization. - Natalia Lylina; Stefan Holst; Hanieh Jafarzadeh; Alexandra Kourfali; Hans-Joachim Wunderlich (IOLTS, 2023)

Robust Pattern Generation for Small Delay Faults Under Process Variations. - Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Zahra Paria Najafi-Haghi; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ITC, 2023)

Test Aspects of System Health State Monitoring. - Hans-Joachim Wunderlich; Hanieh Jafarzadeh; Alexandra Kourfali; Natalia Lylina; Zahra Paria Najafi-Haghi (LATS, 2023)

Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ETS, 2024)

Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing. - Hanieh Jafarzadeh; Florian Klemme; Jan Dennis Reimer; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (ITC, 2024)

Vmin Testing under Variations: Defect vs. Fault Coverage. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (LATS, 2024)

Robust Pattern Generation for Small Delay Faults under the Impact of Variations. - Hanieh Jafarzadeh; Sybille Hellebrand; Hans-Joachim Wunderlich (ETS, 2025)

Robust DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (LATS, 2025)

Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage. - Hanieh Jafarzadeh; Florian Klemme; Hussam Amrouch; Sybille Hellebrand; Hans-Joachim Wunderlich (J. Electron. Test., 2025)