Penalized -regression-based bicluster localization. - Hanjia Gao; Zhengjian Bai; Weiguo Gao; Shuqin Zhang (Pattern Recognit., 2021)

Two Sample Testing in High Dimension via Maximum Mean Discrepancy. - Hanjia Gao; Xiaofeng Shao (J. Mach. Learn. Res., 2023)