Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. - Victor Chao-Wei Kuo; Chih-Ming Chao; Chih-Kai Kang; Li-Wei Liu; Tzung-Bin Huang; Liang-Tai Kuo; Shi-Hsien Chen; Houng-Chi Wei; Hann-Ping Hwang; Saysamone Pittikoun (MTDT, 2006)

Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. - Jia-Lin Wu; Hua-Ching Chien; Chien-Wei Liao; Cheng-Yen Wu; Chih-Yuan Lee; Houng-Chi Wei; Shih-Hsien Chen; Hann-Ping Hwang; Saysamone Pittikoun; Travis Cho; Chin-Hsing Kao (MTDT, 2006)