Mutation analysis with high-level decision diagrams. - Hanno Hantson; Jaan Raik; Maksim Jenihhin; Anton Chepurov; Raimund Ubar; Giuseppe Di Guglielmo; Franco Fummi (LATW, 2010)

Mutation analysis for SystemC designs at TLM. - Valerio Guarnieri; Nicola Bombieri; Graziano Pravadelli; Franco Fummi; Hanno Hantson; Jaan Raik; Maksim Jenihhin; Raimund Ubar (LATW, 2011)

Combining dynamic slicing and mutation operators for ESL correction. - Urmas Repinski; Hanno Hantson; Maksim Jenihhin; Jaan Raik; Raimund Ubar; Giuseppe Di Guglielmo; Graziano Pravadelli; Franco Fummi (ETS, 2012)

Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis. - Hanno Hantson; Urmas Repinski; Jaan Raik; Maksim Jenihhin; Raimund Ubar (LATW, 2012)

On the Reuse of TLM Mutation Analysis at RTL. - Valerio Guarnieri; Giuseppe Di Guglielmo; Nicola Bombieri; Graziano Pravadelli; Franco Fummi; Hanno Hantson; Jaan Raik; Maksim Jenihhin; Raimund Ubar (J. Electron. Test., 2012)

Automated design error debug using high-level decision diagrams and mutation operators. - Jaan Raik; Urmas Repinski; Anton Chepurov; Hanno Hantson; Raimund Ubar; Maksim Jenihhin (Microprocess. Microsystems, 2013)

Automated Design Error Localization in RTL Designs. - Maksim Jenihhin; Anton Tsepurov; Valentin Tihhomirov; Jaan Raik; Hanno Hantson; Raimund Ubar; Gunter Bartsch; Jorge Hernán Meza Escobar; Heinz-Dietrich Wuttke (IEEE Des. Test, 2014)