An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs. - Hans A. R. Manhaeve; Paul L. Wrighton; Jos van Sas; Urbain Swerts (ITC, 1994)

CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. - Viera Stopjaková; Hans A. R. Manhaeve (ED&TC, 1997)

A monolithic off-chip IDDQ monitor. - M. Svajda; B. Straka; Hans A. R. Manhaeve (ED&TC, 1997)

A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. - B. Straka; Hans A. R. Manhaeve; Jozef Vanneuville; M. Svajda (DATE, 1998)

IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. - M. Svajda; B. Straka; Hans A. R. Manhaeve (DATE, 1998)

On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. - Viera Stopjaková; Hans A. R. Manhaeve; M. Sidiropulos (DATE, 1999)

Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. - Hans A. R. Manhaeve; Johan Verfaillie; B. Straka; J. P. Cornil (J. Electron. Test., 2000)

An On-Chip Detection Circuit for the Verification of IC Supply Connections. - Hans A. R. Manhaeve; Stefaan Kerckenaere (DFT, 2001)

A real world application used to implement a true IDDQ based test strategy (facts and figures). - Hans A. R. Manhaeve; Joseph S. Vaccaro; Loren Benecke; David Prystasz (ETW, 2002)

A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field. - Alessandra Fudoli; Alberto Ascagni; Davide Appello; Hans A. R. Manhaeve (ETW, 2003)

Current testing for nanotechnologies: Myths, facts, and figures. - Hans A. R. Manhaeve (IEEE Des. Test Comput., 2004)

Current Testing for Nanotechnologies: A Demystifying Application Perspective.. - Hans A. R. Manhaeve (Asian Test Symposium, 2005)

Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. - B. Straka; Hans A. R. Manhaeve; J. Brenkus; Stefaan Kerckenaere (DATE, 2008)

The Quest for Test: Will Redundancy Cover All? - Hans A. R. Manhaeve (DDECS, 2008)

Current testing: Dead or alive? - Hans A. R. Manhaeve; Pete Harrod; Adit D. Singh; Chintan Patel; Ralf Arnolc; Davide Appello (ETS, 2013)

Semiconductor failure modes and mitigation for critical systems embedded tutorial. - Hans A. R. Manhaeve; Esko Mikkola (ETS, 2013)

Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN). - Dimitris Gizopoulos; Said Hamdioui; Hans A. R. Manhaeve (J. Electron. Test., 2013)

Dependable Multicore Architectures at Nanoscale: The View From Europe. - Marco Ottavi; Salvatore Pontarelli; Dimitris Gizopoulos; Cristiana Bolchini; Maria K. Michael; Lorena Anghel; Mehdi Baradaran Tahoori; Antonis M. Paschalis; Pedro Reviriego; Oliver Bringmann 001; Viacheslav Izosimov; Hans A. R. Manhaeve; et al. (IEEE Des. Test, 2015)

On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. - Ghazanfar Ali; Leila Bagheriye; Hans A. R. Manhaeve; Hans G. Kerkhoff (ATS, 2020)