Multiple-Valued Logic Charge-Coupled Devices. - Hans G. Kerkhoff; Marius L. Tervoert (IEEE Trans. Computers, 1981)

TASTE: A Tool for Analog System Testability Evaluation. - Gertjan J. Hemink; Berend W. Meijer; Hans G. Kerkhoff (ITC, 1988)

Multiple-Valued CCD Circuits. - Jon T. Butler; Hans G. Kerkhoff (Computer, 1988)

A Comparative Analysis of Multiplexer Techniques for the Minimization of Function Cost Using the Costtable Approach. - Jon T. Butler; Hans G. Kerkhoff; Siep Onneweer (ISMVL, 1990)

Designing and Implementing an Architecture with Boundary Scan. - R. P. van Riessen; Hans G. Kerkhoff; A. Kloppenburg (IEEE Des. Test Comput., 1990)

Testability analysis of analog systems. - Gertjan J. Hemink; Berend W. Meijer; Hans G. Kerkhoff (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

A performance analysis tool for performance-driven micro-cell generation. - Rafael Peset Llopis; R. J. H. Koopman; Hans G. Kerkhoff; J. A. Braat (EURO-DAC, 1991)

A design-for-testability expert system for silicon compilers. - R. P. van Riessen; Hans G. Kerkhoff; J. M. J. Janssen (VTS, 1991)

A fast and accurate characterization method for full-CMOS circuits. - Rafael Peset Llopis; Hans G. Kerkhoff (EURO-DAC, 1992)

Gate delay fault test generation for non-scan circuits. - G. Van Brakel; Uwe Gläser; Hans G. Kerkhoff; Heinrich Theodor Vierhaus (ED&TC, 1995)

Test Structures on MCM Active Substrate: Is it worthwhile? - Joan Oliver; Hans G. Kerkhoff (ED&TC, 1996)

MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation. - Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Han Speek; Nur Engin (ICECS, 1996)

Compact structural test generation for analog macros. - V. Kaal; Hans G. Kerkhoff (ED&TC, 1997)

Smart sensor system application: an integrated compass. - Ronald J. W. T. Tangelder; G. Diemel; Hans G. Kerkhoff (ED&TC, 1997)

Microsystem Testing: Challenge or Common Knowledge? - Hans G. Kerkhoff (Asian Test Symposium, 1998)

Configurations for IDDQ-Testable PLAs. - Manoj Sachdev; Hans G. Kerkhoff (IEEE Des. Test Comput., 1999)

Integrated Design and Test of Mixed-Signal Circuits. - Nur Engin; Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Han Speek (J. Electron. Test., 1999)

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. - Chris Feige; Jan Ten Pierick; Clemens Wouters; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (J. Electron. Test., 1999)

Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. - Richard Rosing; Hans G. Kerkhoff; Ronald J. W. T. Tangelder; Manoj Sachdev (J. Electron. Test., 1999)

Design and Test Space Exploration of Transport-Triggered Architectures. - V. A. Zivkovic; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (DATE, 2000)

Bridging the testing speed gap: design for delay testability. - Han Speek; Hans G. Kerkhoff; Manoj Sachdev; Mansour Shashaani (ETW, 2000)

A Low-Speed BIST Framework for High-Performance Circuit Testing. - Hans G. Kerkhoff; Mansour Shashaani; Manoj Sachdev (VTS, 2000)

Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. - Liquan Fang; Guido Gronthoud; Hans G. Kerkhoff (ETW, 2001)

Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. - Herman J. Vermaak; Hans G. Kerkhoff (ETW, 2001)

Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. - Octavian Petre; Hans G. Kerkhoff (IOLTW, 2001)

Tackling test trade-offs from design, manufacturing to market using economic modeling. - Erik H. Volkerink; Ajay Khoche; Linda A. Kamas; Jochen Rivoir; Hans G. Kerkhoff (ITC, 2001)

Modeling a Verification Test System for Mixed-Signal Circuits. - David San Segundo Bello; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (IEEE Des. Test Comput., 2001)

Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems. - Hans G. Kerkhoff; Hans P. A. Hendriks (J. Electron. Test., 2001)

Design for Delay Testability in High-Speed Digital ICs. - Hans G. Kerkhoff; Han Speek; M. Shashani; Manoj Sachdev (J. Electron. Test., 2001)

Testing of a microanalysis system. - Hans G. Kerkhoff (IEEE Trans. Instrum. Meas., 2001)

On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. - Octavian Petre; Hans G. Kerkhoff (Asian Test Symposium, 2002)

Testable Design and Testing of High-Speed Superconductor Microelectronics. - Hans G. Kerkhoff; Arun A. Joseph; Sander Heuvelmans (DELTA, 2002)

Automatic Scan Insertion and Test Generation for Asynchronous Circuits. - Frank te Beest; Ad M. G. Peeters; Marc Verra; Kees van Berkel 001; Hans G. Kerkhoff (ITC, 2002)

A New Test Generation Approach for Embedded Analogue Cores in SoC. - M. Stancic; Liquan Fang; M. H. H. Weusthof; R. M. W. Tijink; Hans G. Kerkhoff (ITC, 2002)

SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? - Salvador Mir; H. Bederr; R. D. (Shawn) Blanton; Hans G. Kerkhoff; H. J. Klim (VTS, 2002)

An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures. - V. A. Zivkovic; Ronald J. W. T. Tangelder; Hans G. Kerkhoff (J. Electron. Test., 2002)

Scan test strategy for asynchronous-synchronous interfaces [SoC testing]. - Octavian Petre; Hans G. Kerkhoff (ETW, 2003)

Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores. - H. J. Vermaak; Hans G. Kerkhoff (ETW, 2003)

Towards Structural Testing of Superconductor Electronics. - Arun A. Joseph; Hans G. Kerkhoff (ITC, 2003)

Testable Design and Testing of Micro-Electro-Fluidic Arrays. - Hans G. Kerkhoff; Mustafa Acar (VTS, 2003)

Fast Fault Simulation for Nonlinear Analog Circuits. - Nur Engin; Hans G. Kerkhoff (IEEE Des. Test Comput., 2003)

Synchronous Full-Scan for Asynchronous Handshake Circuits. - Frank te Beest; Ad M. G. Peeters; Kees van Berkel 001; Hans G. Kerkhoff (J. Electron. Test., 2003)

Analog and mixed signal test techniques for SoCs. - Hans G. Kerkhoff; Bozena Kaminska (Microelectron. J., 2003)

Testability-analysis driven test-generation of analogue cores. - M. Stancic; Hans G. Kerkhoff (Microelectron. J., 2003)

Testability Issues in Superconductor Electronic. - Hans G. Kerkhoff; Arun A. Joseph (DELTA, 2004)

Scan Test Strategy for Asynchronous-Synchronous Interfaces. - Octavian Petre; Hans G. Kerkhoff (J. Electron. Test., 2004)

Testing of MEMS-based microsystems. - Hans G. Kerkhoff (ETS, 2005)

The test search for true mixed-signal cores. - Hans G. Kerkhoff (Microelectron. J., 2005)

Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. - Hans G. Kerkhoff; Xiao Zhang 002; R. W. Barber; D. R. Emerson (DELTA, 2006)

Testing Microelectronic Biofluidic Systems. - Hans G. Kerkhoff (IEEE Des. Test Comput., 2007)

Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications. - Hans G. Kerkhoff; Jarkko J. M. Huijts (DELTA, 2008)

Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications. - Oscar Kuiken; Xiao Zhang 002; Hans G. Kerkhoff (DFT, 2008)

A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data. - Hans G. Kerkhoff; Xiao Zhang 002; Frédérick Mailly; Pascal Nouet; Hongyuan Liu 001; Andrew Richardson 001 (VLSI Design, 2008)

Design of a Highly Dependable Beamforming Chip. - Xiao Zhang 002; Hans G. Kerkhoff (DSD, 2009)

Algorithms for ADC Multi-site Test with Digital Input Stimulus. - Xiaoqin Sheng; Hans G. Kerkhoff; Amir Zjajo; Guido Gronthoud (ETS, 2009)

Fault co-simulation for test evaluation of heterogeneous integrated biological systems. - Hans G. Kerkhoff; Xiao Zhang 002 (Microelectron. J., 2009)

The Test Ability of an Adaptive Pulse Wave for ADC Testing. - Xiaoqin Sheng; Hans G. Kerkhoff (Asian Test Symposium, 2010)

Block-level bayesian diagnosis of analogue electronic circuits. - Shaji Krishnan; Klaas D. Doornbos; Rudi Brand; Hans G. Kerkhoff (DATE, 2010)

Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor. - Hans G. Kerkhoff; Xiao Zhang 002 (DELTA, 2010)

On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. - Xiao Zhang 002; Hans G. Kerkhoff; Bart Vermeulen (DSD, 2010)

Multivariate model for test response analysis. - Shaji Krishnan; Hans G. Kerkhoff (ETS, 2010)

Predicting dynamic specifications of ADCs with a low-quality digital input signal. - Xiaoqin Sheng; Vincent Kerzerho; Hans G. Kerkhoff (ETS, 2010)

New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. - Xiao Zhang 002; Hans G. Kerkhoff; Bart Vermeulen (ETS, 2010)

On-line dependability enhancement of multiprocessor SoCs by resource management. - Timon D. ter Braak; S. T. Burgess; H. Hurskainen; Hans G. Kerkhoff; Bart Vermeulen; Xiao Zhang 002 (SoC, 2010)

A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DDECS, 2011)

SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DFT, 2011)

A Technique for Accelerating Injection of Transient Faults in Complex SoCs. - Alireza Rohani; Hans G. Kerkhoff (DSD, 2011)

Study of the effects of SET induced faults on submicron technologies. - Alireza Rohani; Hans G. Kerkhoff (DSN Workshops, 2011)

A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. - Shaji Krishnan; Hans G. Kerkhoff (ETS, 2011)

Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs. - Jinbo Wan; Hans G. Kerkhoff (ISOCC, 2011)

A Dependability Solution for Homogeneous MPSoCs. - Xiao Zhang 002; Hans G. Kerkhoff (PRDC, 2011)

Monitoring active filters under automotive aging scenarios with embedded instrument. - Jinbo Wan; Hans G. Kerkhoff (DATE, 2012)

The design of dependable flexible multi-sensory System-on-Chips for security applications. - Hans G. Kerkhoff; Yong Zhao (DDECS, 2012)

An on-line soft error mitigation technique for control logic of VLIW processors. - Alireza Rohani; Hans G. Kerkhoff (DFT, 2012)

Investigating Dependability of Short-Range Wireless Embedded Systems through Hardware Platform Based Design. - Benaoumeur Senouci; Anne-Johan Annema; Mark J. Bentum; Hans G. Kerkhoff (DSD, 2012)

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus. - Xiaoqin Sheng; Hans G. Kerkhoff; Amir Zjajo; Guido Gronthoud (J. Electron. Test., 2012)

An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DDECS, 2013)

Analysing degradation effects in charge-redistribution SAR ADCs. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DFTS, 2013)

The Essence of Reliability Estimation during Operational Life for Achieving High System Dependability. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DSD, 2013)

Monitoring operating temperature and supply voltage in achieving high system dependability. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DTIS, 2013)

Power-dissipation comparison of two dependability approaches for multi-processor systems. - Yong Zhao; Xiao Zhang 002; Hans G. Kerkhoff (DTIS, 2013)

An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. - Jinbo Wan; Hans G. Kerkhoff (ISQED, 2013)

Pulse-length determination techniques in the rectangular single event transient fault model. - Alireza Rohani; Hans G. Kerkhoff; Enrico Costenaro; Dan Alexandrescu (ICSAMOS, 2013)

Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. - Shaji Krishnan; Hans G. Kerkhoff (IEEE Des. Test, 2013)

Rapid transient fault insertion in large digital systems. - Alireza Rohani; Hans G. Kerkhoff (Microprocess. Microsystems, 2013)

An embedded offset and gain instrument for OpAmp IPs. - Jinbo Wan; Hans G. Kerkhoff (DATE, 2014)

Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. - Muhammad Aamir Khan 002; Hans G. Kerkhoff (DDECS, 2014)

Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation. - Yong Zhao; Hans G. Kerkhoff (DSD, 2014)

Linking aging measurements of health-monitors and specifications for multi-processor SoCs. - Hans G. Kerkhoff; Jinbo Wan; Yong Zhao (DTIS, 2014)

Two soft-error mitigation techniques for functional units of DSP processors. - Alireza Rohani; Hans G. Kerkhoff (ETS, 2014)

iJTAG integration of complex digital embedded instruments. - Ahmed Ibrahim 001; Hans G. Kerkhoff (IDT, 2014)

Day 1: Invited talk 2: Dependable mixed-signal integrated systems under aging. - Hans G. Kerkhoff (IDT, 2014)

Intermittent Resistive Faults in Digital CMOS Circuits. - Hans G. Kerkhoff; Hassan Ebrahimi (DDECS, 2015)

Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor. - Yong Zhao; Hans G. Kerkhoff (DSD, 2015)

Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. - Yong Zhao; Hans G. Kerkhoff (DTIS, 2015)

New drain current model for nano-meter MOS transistors on-chip threshold voltage test. - Jinbo Wan; Hans G. Kerkhoff (ETS, 2015)

Online digital offset voltage compensation method for AMR sensors. - Andreina Zambrano; Hans G. Kerkhoff (I2MTC, 2015)

On the maximization of the sustained switching activity in a processor. - Riccardo Cantoro; Matteo Sonza Reorda; Alireza Rohani; Hans G. Kerkhoff (IOLTS, 2015)

Fault-tolerant system for catastrophic faults in AMR sensors. - Andreina Zambrano; Hans G. Kerkhoff (IOLTS, 2015)

Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. - Jinbo Wan; Hans G. Kerkhoff (NEWCAS, 2015)

Highly Dependable Multi-processor SoCs Employing Lifetime Prediction Based on Health Monitors. - Yong Zhao; Hans G. Kerkhoff (ATS, 2016)

Detecting intermittent resistive faults in digital CMOS circuits. - Hassan Ebrahimi; Alireza Rohani; Hans G. Kerkhoff (DFT, 2016)

Efficient utilization of hierarchical iJTAG networks for interrupts management. - Ahmed Ibrahim 001; Hans G. Kerkhoff (DFT, 2016)

Testing for Intermittent Resistive Faults in CMOS Integrated Systems. - Hassan Ebrahimi; Hans G. Kerkhoff (DSD, 2016)

A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing. - Yong Zhao; Hans G. Kerkhoff (DTIS, 2016)

Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. - Ahmed Ibrahim 001; Hans G. Kerkhoff (ETS, 2016)

Designing reliable cyber-physical systems overview associated to the special session at FDL'16. - Gadi Aleksandrowicz; Eli Arbel; Roderick Bloem; Timon D. ter Braak; Sergei Devadze; Görschwin Fey; Maksim Jenihhin; Artur Jutman; Hans G. Kerkhoff; Robert Könighofer; Jan Malburg; Shiri Moran; et al. (FDL, 2016)

Accessing on-chip temperature health monitors using the IEEE 1687 standard. - Ghazanfar Ali; Ahmed Badawy; Hans G. Kerkhoff (ICECS, 2016)

Towards an automated and reusable in-field self-test solution for MPSoCs. - Ahmed Ibrahim 001; Hans G. Kerkhoff (ICM, 2016)

Online monitoring of the maximum angle error in AMR sensors. - Andreina Zambrano; Hans G. Kerkhoff (IOLTS, 2016)

A software framework to calculate local temperatures in CMOS processors. - Alireza Rohani; Hassan Ebrahimi; Hans G. Kerkhoff (PATMOS, 2016)

Online digital compensation Method for AMR sensors. - Andreina Zambrano; Hans G. Kerkhoff (VLSI-SoC, 2016)

Thermal issues in test: An overview of the significant aspects and industrial practice. - Juergen Alt; Paolo Bernardi; Alberto Bosio; Riccardo Cantoro; Hans G. Kerkhoff; Andreas Leininger; Wolfgang Molzer; Alessandro Motta; Christian Pacha; Alberto Pagani; Alireza Rohani; R. Strasser (VTS, 2016)

Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. - Hans G. Kerkhoff; Hassan Ebrahimi (J. Circuits Syst. Comput., 2016)

BASTION: Board and SoC test instrumentation for ageing and no failure found. - Artur Jutman; Christophe Lotz; Erik Larsson; Matteo Sonza Reorda; Maksim Jenihhin; Jaan Raik; Hans G. Kerkhoff; Rene Krenz-Baath; Piet Engelke (DATE, 2017)

Improving the dependability of AMR sensors used in automotive applications. - Andreina Zambrano; Hans G. Kerkhoff (ETS, 2017)

A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. - Ahmed Ibrahim 001; Hans G. Kerkhoff (IOLTS, 2017)

An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability. - Hans G. Kerkhoff; Ghazanfar Ali; Hassan Ebrahimi; Ahmed Ibrahim 001 (ITC-Asia, 2017)

A dependable AMR sensor system for automotive applications. - Andreina Zambrano; Hans G. Kerkhoff (ITC-Asia, 2017)

Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems. - Hans G. Kerkhoff; Ghazanfar Ali; Jinbo Wan; Ahmed Ibrahim 001; Jerrin Pathrose (VLSI-SoC, 2017)

Structured scan patterns retargeting for dynamic instruments access. - Ahmed Ibrahim 001; Hans G. Kerkhoff (VTS, 2017)

Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments. - Jerrin Pathrose; Ghazanfar Ali; Hans G. Kerkhoff (APCCAS, 2018)

Intermittent Resistance Fault Detection at Board Level. - Hassan Ebrahimi; Hans G. Kerkhoff (DDECS, 2018)

Design and implementation of a dependable CPSoC for automotive applications. - Ghazanfar Ali; Hassan Ebrahimi; Jerrin Pathrose; Hans G. Kerkhoff (ICPS, 2018)

IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. - Jerrin Pathrose; Ghazanfar Ali; Hans G. Kerkhoff (LATS, 2018)

On-Chip Lifetime Prediction for Dependable Many-Processor SoCs Based on Data Fusion. - Ghazanfar Ali; Jerrin Pathrose; Hans G. Kerkhoff (MCSoC, 2018)

Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. - Jerrin Pathrose; Leon van de Logt; Hans G. Kerkhoff (DFT, 2019)

IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. - Ghazanfar Ali; Jerrin Pathrose; Hans G. Kerkhoff (ETS, 2019)

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. - Ahmed M. Y. Ibrahim; Hans G. Kerkhoff (ITC-Asia, 2019)

DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips. - Ahmed M. Y. Ibrahim; Hans G. Kerkhoff (ITC, 2019)

IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time. - Ghazanfar Ali; Jerrin Pathrose; Hans G. Kerkhoff (LATS, 2019)

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. - Ahmed M. Y. Ibrahim; Hans G. Kerkhoff; Abrar Ibrahim; Mona Safar; M. Watheq El-Kharashi (VTS, 2019)

A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level. - Hassan Ebrahimi; Hans G. Kerkhoff (J. Circuits Syst. Comput., 2019)

On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. - Ghazanfar Ali; Leila Bagheriye; Hans A. R. Manhaeve; Hans G. Kerkhoff (ATS, 2020)

A New Monitor Insertion Algorithm for Intermittent Fault Detection. - Hassan Ebrahimi; Hans G. Kerkhoff (ETS, 2020)

Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. - Leila Bagheriye; Ghazanfar Ali; Hans G. Kerkhoff (IOLTS, 2020)

On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-Learning. - Ghazanfar Ali; Leila Bagheriye; Hans G. Kerkhoff (ISCAS, 2020)

Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. - Hassan Ebrahimi; Hans G. Kerkhoff (DDECS, 2021)