Interband-Tunneling III-V Semiconductor Structures for Multiple-Valued Literal and Arithmetic Functions. - Lutz J. Micheel; Hans L. Hartnagel; Wallace T. Anderson; Stephen W. Kirchoefer; Nicolas A. Papanicolaou (ISMVL, 1994)

Interband RTDs with Nanoelectronic HBT-LED Structures for Multiple-Valued Computation. - Lutz J. Micheel; Hans L. Hartnagel (ISMVL, 1996)

New devices for millimeter-wave applications. - Hans L. Hartnagel (Ann. des Télécommunications, 1997)

A GaAs pressure sensor with frequency output based on resonant tunneling diodes. - Kabula Mutamba; Michael Flath; Anna Sigurdardóttir; Alexander Vogt; Hans L. Hartnagel (IEEE Trans. Instrum. Meas., 1999)

Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. - Cezary Sydlo; Bastian Mottet; Husin Ganis; Hans L. Hartnagel; Viktor Krozer; Sylvain L. Delage; Simone Cassette; Eric Chartier; D. Floriot; Steven Bland (Microelectron. Reliab., 2001)

Process Control and Failure Analysis Implementation for THz Schottky-based components. - V. Ichizli; Manuel Rodríguez-Gironés; L. Marchand; C. Garden; Oleg Cojocari; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Reliability investigations on HBV using pulsed electrical stress. - Cezary Sydlo; M. Saglam; Bastian Mottet; Manuel Rodríguez-Gironés; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress. - Cezary Sydlo; Kabula Mutamba; L. Divac Krnic; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2003)

A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. - Stephan Biber; Oleg Cojocari; Günther Rehm; Bastian Mottet; Manuel Rodríguez-Gironés; Lorenz-Peter Schmidt; Hans L. Hartnagel (IEEE Trans. Instrum. Meas., 2004)

Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning. - Cezary Sydlo; Jochen Sigmund; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2005)

Low-Temperature Grown GaAsSb with Sub-Picosecond Photocarrier Lifetime for Continuous-Wave Terahertz Measurements. - Jochen Sigmund; Jean-François Lampin; Valentin Ivannikov; Cezary Sydlo; Michail Feiginov; Dimitris Pavlidis; Peter Meissner; Hans L. Hartnagel (IEICE Trans. Electron., 2008)

Bit Error Probability in the Presence of Passive Intermodulation. - Ahmed Al-Mudhafar; Hans L. Hartnagel (IEEE Commun. Lett., 2012)