Multiple-field approach for aberration correction in miniature imaging systems based on wafer-level production. - Eric Logean; Toralf Scharf; Nicolas Bongard; Hans Peter Herzig; Markus Rossi (Multimedia Content and Mobile Devices, 2013)

4th International Symposium on Sensor Science (I3S2015): Conference Report. - Peter Seitz 001; Debbie G. Senesky; Michael J. Schöning; Peter C. Hauser; Roland Moser; Hans Peter Herzig; Assefa M. Melesse; Patricia A. Broderick; Patrick Eugster (Sensors, 2015)