Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits. - José Pineda de Gyvez; Hans Tuinhout (IEEE J. Solid State Circuits, 2004)

Analog circuits in ultra-deep-submicron CMOS. - Anne-Johan Annema; Bram Nauta; Ronald van Langevelde; Hans Tuinhout (IEEE J. Solid State Circuits, 2005)

Parametric Mismatch Characterization for Mixed-Signal Technologies. - Hans Tuinhout; Nicole Wils; Pietro Andricciola (IEEE J. Solid State Circuits, 2010)

Characterization of matching variability and low-frequency noise for mixed-signal technologies. - Hans Tuinhout (CICC, 2013)

Random Telegraph Noise in Analog CMOS Circuits. - Maurício Banaszeski da Silva; Gilson I. Wirth; Hans P. Tuinhout; Adrie Zegers-van Duijnhoven; Andries J. Scholten (IEEE Trans. Circuits Syst. I Regul. Pap., 2023)