Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. - M. H. Konijnenburg; Hans van der Linden; Ad J. van de Goor (Asian Test Symposium, 1999)

Benchmarking DAT with the ITC'99 ATPG Benchmarks. - Mario Konijnenburg; Hans van der Linden; Jeroen Geuzebroek (ITC, 1999)

www.immaterieelerfgoed.be: A platform for intangible cultural heritage in Flanders (Belgium). - Ellen Janssens; Hans van der Linden; Bram Wiercx (Digital Heritage (2), 2013)