Counting electrons one by one-overview of a joint European research project. - Helko E. van den Brom; Oswin Kerkhof; Sergey V. Lotkhov; Sergey A. Bogoslovsky; Gerd-Dietmar Willenberg; Hansjörg Scherer; Alexander B. Zorin; S. Pedersen; C. Kristoffersson; A. Aassime; Per Delsing; Marian A. Taslakov; et al. (IEEE Trans. Instrum. Meas., 2003)

Steps toward a capacitance standard based on single-electron counting at PTB. - Hansjörg Scherer; Sergey V. Lotkhov; Gerd-Dietmar Willenberg; Alexander B. Zorin (IEEE Trans. Instrum. Meas., 2005)

Improved Cryogenic Current Comparator Setup With Digital Current Sources. - Martin Götz; Dietmar Drung; Eckart Pesel; Henry-Jobes Barthelmess; Colmar Hinnrichs; Cornelia Aßmann; Margret Peters; Hansjörg Scherer; Bernd Schumacher; Thomas Schurig (IEEE Trans. Instrum. Meas., 2009)

Progress Towards the Electron Counting Capacitance Standard at PTB. - Hansjörg Scherer; Sergey V. Lotkhov; Gerd-Dietmar Willenberg; B. Camarota (IEEE Trans. Instrum. Meas., 2009)

Improving the Traceable Measurement and Generation of Small Direct Currents. - Dietmar Drung; Martin Götz; Eckart Pesel; Hansjörg Scherer (IEEE Trans. Instrum. Meas., 2015)

Externally Referenced Current Source With Stability Down to 1 nA/A at 50 mA. - Isaac Fan; Ralf Behr; Dietmar Drung; Christian Krause 004; Martin Götz; Eckart Pesel; Hansjörg Scherer (IEEE Trans. Instrum. Meas., 2019)

Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty. - Stephen P. Giblin; Dietmar Drung; Martin Götz; Hansjörg Scherer (IEEE Trans. Instrum. Meas., 2019)

Calibrating Ultrastable Low-Noise Current Amplifiers of the Second Generation With a Cryogenic Current Comparator. - Martin Götz; Dietmar Drung; Christian Krause 004; Ulrich Becker; Hansjörg Scherer (IEEE Trans. Instrum. Meas., 2019)

Electrometer Calibration With Sub-Part-Per-Million Uncertainty. - Hansjörg Scherer; Dietmar Drung; Christian Krause 004; Martin Götz; Ulrich Becker (IEEE Trans. Instrum. Meas., 2019)

Performance and Stability Assessment of Graphene-Based Quantum Hall Devices for Resistance Metrology. - Atasi Chatterjee; Mattias Kruskopf; Martin Götz; Yefei Yin; Eckart Pesel; Pierre Gournay; Benjamin Rolland; Jan Kucera 001; Stephan Bauer; Klaus Pierz; Bernhard Schumacher; Hansjörg Scherer (IEEE Trans. Instrum. Meas., 2023)