Fault Scrambling Techniques for Yield Enhancement of Embedded Memories. - Shyue-Kung Lu; Hao-Cheng Jheng; Masaki Hashizume; Jiun-Lang Huang; Pony Ning (Asian Test Symposium, 2013)

Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories. - Shyue-Kung Lu; Hao-Cheng Jheng; Hao-Wei Lin; Masaki Hashizume; Seiji Kajihara (ATS, 2014)

Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. - Shyue-Kung Lu; Hao-Cheng Jheng; Hao-Wei Lin; Masaki Hashizume (J. Electron. Test., 2018)