Prediction of Capacitor's Accelerated Aging Based on Advanced Measurements and Deep Neural Network Techniques. - Hao Liu 042; Tim Claeys; Davy Pissoort; Guy A. E. Vandenbosch (IEEE Trans. Instrum. Meas., 2020)

Long-Term Prediction of Multistress Accelerated Aging of Capacitors by Long Short-Term Memory Network. - Hao Liu 042; Tim Claeys; Davy Pissoort; Guy A. E. Vandenbosch (IEEE Trans. Instrum. Meas., 2023)