LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. - Zhengfeng Huang; Shangjie Pan; Hao Wang 169; Huaguo Liang; Tianming Ni (Microelectron. J., 2021)

A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. - Zhengfeng Huang; Hao Wang 169; Yang Ang; Huaguo Liang; Yiming Ouyang; Tianming Ni (Microelectron. J., 2021)

A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. - Yingchun Lu; Guangzhen Hu; Jianan Wang; Hao Wang 169; Liang Yao; Huaguo Liang; Maoxiang Yi; Zhengfeng Huang (J. Electron. Test., 2022)

Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. - Zhengfeng Huang; Hao Wang 169; Dongxing Ma; Huaguo Liang; Yiming Ouyang; Aibin Yan (J. Electron. Test., 2023)