Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression. - Wuhua Li; Yunjie Gu; Haoze Luo; Wenfeng Cui; Xiangning He; Changliang Xia (IEEE Trans. Ind. Electron., 2015)

Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface. - Wuhua Li; Chi Xu; Haoze Luo; Yihua Hu; Xiangning He; Changliang Xia (IEEE Trans. Ind. Electron., 2015)

Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters. - Sheng Zong; Haoze Luo; Wuhua Li; Xiangning He; Changliang Xia (IEEE Trans. Ind. Electron., 2015)

Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. - Haoze Luo; Francesco Iannuzzo; Paula Diaz Reigosa; Frede Blaabjerg; Wuhua Li; Xiangning He (Microelectron. Reliab., 2016)

Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. - Haoze Luo; Francesco Iannuzzo; Frede Blaabjerg; Wuhua Li; Xiangning He (IECON, 2017)

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules. - Haoze Luo; Nick Baker; Francesco Iannuzzo; Frede Blaabjerg (Microelectron. Reliab., 2017)

Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design. - Haoze Luo; Wuhua Li; Xiangning He; Francesco Iannuzzo; Frede Blaabjerg (Microelectron. Reliab., 2017)

Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. - Lorenzo Ceccarelli; Haoze Luo; Francesco Iannuzzo (Microelectron. Reliab., 2018)

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. - Haoze Luo; Paula Diaz Reigosa; Francesco Iannuzzo; Frede Blaabjerg (Microelectron. Reliab., 2018)

Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules. - Haoze Luo; Wuhua Li; Francesco Iannuzzo; Xiangning He; Frede Blaabjerg (IEEE Trans. Ind. Electron., 2018)

AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. - Kongjing Li; Gui Yun Tian 001; Xiaotian Chen; Chaoqing Tang; Haoze Luo; Wuhua Li; Bin Gao 003; Xiangning He; Nick Wright (IEEE Trans. Ind. Electron., 2019)

Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition. - Jianlong Kang; Qing Liu 031; Haoze Luo; Hu Cao; Zi-Hui Zhang; Zhen Xin (IEEE Trans. Ind. Electron., 2023)