Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase. - Kai Esmark; Wolfgang Stadler; M. Wendel; Harald Gossner; X. Guggenmos; Wolfgang Fichtner (Microelectron. Reliab., 2001)

Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. - Harald Gossner; T. Müller-Lynch; Kai Esmark; Matthias Stecher (Microelectron. Reliab., 2001)

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. - Martin Litzenberger; R. Pichler; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Kai Esmark; Harald Gossner (Microelectron. Reliab., 2001)

Device Simulation and Backside Laser Interferometry–Powerful Tools for ESD Protection Development. - Wolfgang Stadler; Kai Esmark; Harald Gossner; Martin Streibl; M. Wendel; Wolfgang Fichtner; Dionyz Pogany; Martin Litzenberger; Erich Gornik (Microelectron. Reliab., 2002)

Case study of a technology transfer causing ESD problems. - Franz Zängl; Harald Gossner; Kai Esmark; R. Owen; G. Zimmermann (Microelectron. Reliab., 2002)

Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. - Martin Streibl; Kai Esmark; A. Sieck; Wolfgang Stadler; M. Wendel; J. Szatkowski; Harald Gossner (Microelectron. Reliab., 2003)

ESD protection for the deep sub micron regime - a challenge for design methodology. - Harald Gossner (VLSI Design, 2004)

High abstraction level permutational ESD concept analysis. - Martin Streibl; Franz Zängl; Kai Esmark; Robert Schwencker; Wolfgang Stadler; Harald Gossner; S. Drüen; Doris Schmitt-Landsiedel (Microelectron. Reliab., 2005)

A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits. - Heinrich Wolf; Horst A. Gieser; Wolfgang Soldner; Harald Gossner (Microelectron. Reliab., 2005)

Circuit design issues in multi-gate FET CMOS technologies. - Christian Pacha; Klaus von Arnim; Thomas Schulz; Weize Xiong; Michael Gostkowski; Gerhard Knoblinger; Andrew Marshall; Thomas Nirschl; Jörg Berthold; Christian Russ; Harald Gossner; Charvaka Duvvury; et al. (ISSCC, 2006)

High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications. - Moon-Jung Kim; Henrik Icking; Harald Gossner; Thomas H. Lee (CICC, 2007)

A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection. - Wolfgang Soldner; Moon-Jung Kim; Martin Streibl; Harald Gossner; Thomas H. Lee; Doris Schmitt-Landsiedel (ISSCC, 2007)

RF ESD protection strategies: Codesign vs. low-C protection. - Wolfgang Soldner; Martin Streibl; U. Hodel; Marc Tiebout; Harald Gossner; Doris Schmitt-Landsiedel; Jung-Hoon Chun; Choshu Ito; Robert W. Dutton (Microelectron. Reliab., 2007)

Reliability aspects of gate oxide under ESD pulse stress. - Adrien Ille; Wolfgang Stadler; Thomas Pompl; Harald Gossner; Tilo Brodbeck; Kai Esmark; Philipp Riess; David Alvarez; Kiran V. Chatty; Robert Gauthier 002; Alain Bravaix (Microelectron. Reliab., 2009)

Do ESD fails in systems correlate with IC ESD robustness? - Wolfgang Stadler; Tilo Brodbeck; Reinhold Gärtner; Harald Gossner (Microelectron. Reliab., 2009)

System ESD robustness by co-design of on-chip and on-board protection measures. - Harald Gossner; Werner Simbürger; Matthias Stecher (Microelectron. Reliab., 2010)

Electronic design automation (EDA) solutions for ESD-robust design and verification. - Michael G. Khazhinsky; Shuqing Cao; Harald Gossner; Gianluca Boselli; Melanie Etherton (CICC, 2012)

System efficient ESD design. - Harald Gossner; Charvaka Duvvury (Microelectron. Reliab., 2015)

A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. - Ankur Gupta; Mayank Shrivastava; Maryam Shojaei Baghini; Harald Gossner; V. Ramgopal Rao (VLSID, 2016)

Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? - Milova Paul; Christian Russ; Boeila Sampath Kumar; Harald Gossner; Mayank Shrivastava (VLSID, 2017)

Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. - Milova Paul; Boeila Sampath Kumar; Harald Gossner; Mayank Shrivastava (IRPS, 2018)

System-Efficient ESD Design Based on a Modular Measurement System Applied to USB. - Lucas Speckbacher; David Johannes Pommerenke; Gabriel Fellner; Lukas Pertoll; Harald Gossner (IEEE Trans. Instrum. Meas., 2025)