Wafer-Level Die Re-Test Success Prediction Using Machine Learning. - Hardi Selg; Maksim Jenihhin; Peeter Ellervee (LATS, 2020)

JÄNES: A NAS Framework for ML-based EDA Applications. - Hardi Selg; Maksim Jenihhin; Peeter Ellervee (DFT, 2021)

ML-Based Online Design Error Localization for RISC-V Implementations. - Hardi Selg; Maksim Jenihhin; Peeter Ellervee; Jaan Raik (IOLTS, 2023)

Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs. - Hardi Selg; Konstantin Shibin; Anton Tsertov; Maksim Jenihhin; Peeter Ellervee; Jaan Raik (DFT, 2024)

Keynote: Cost-Efficient Reliability for Edge-AI Chips. - Maksim Jenihhin; Mahdi Taheri; Natalia Cherezova; Mohammad Hasan Ahmadilivani; Hardi Selg; Artur Jutman; Konstantin Shibin; Anton Tsertov; Sergei Devadze; Rama Mounika Kodamanchili; Ahsan Rafiq; Jaan Raik; et al. (LATS, 2024)