Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults. - Hari Addepalli; Irith Pomeranz; M. Enamul Amyeen; Suriyaprakash Natarajan; Arani Sinha; Srikanth Venkataraman (ATS, 2022)

Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied Tests. - Hari Addepalli; Irith Pomeranz (ACM Great Lakes Symposium on VLSI, 2022)

Generating Storage-Aware Test Sets Targeting Several Fault Models. - Hari Addepalli; Irith Pomeranz; M. Enamul Amyeen; Suriyaprakash Natarajan; Arani Sinha; Srikanth Venkataraman (ISVLSI, 2024)

Delay Monitoring Under Different PVT Corners for Test and Functional Operation. - Hari Addepalli; Jiezhong Wu; Nilanjan Mukherjee 001; Irith Pomeranz; Janusz Rajski (ITC, 2024)