Improvement of SRAM-based failure analysis using calibrated Iddq testing. - Hari Balachandran; D. M. H. Walker (VTS, 1996)

On applying non-classical defect models to automated diagnosis. - Jayashree Saxena; Kenneth M. Butler; Hari Balachandran; David B. Lavo; Tracy Larrabee; F. Joel Ferguson; Brian Chess (ITC, 1998)

Expediting ramp-to-volume production. - Hari Balachandran; Jason Parker; Gordon Gammie; John W. Olson; Craig Force; Kenneth M. Butler; Sri Jandhyala (ITC, 1999)

Correlation of logical failures to a suspect process step. - Hari Balachandran; Jason Parker; Daniel Shupp; Stephanie Butler; Kenneth M. Butler; Craig Force; Jason Smith (ITC, 1999)

Clustering based techniques for I_DDQ testing. - Sri Jandhyala; Hari Balachandran; Anura P. Jayasumana (ITC, 1999)

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. - Michael R. Grimaila; Sooryong Lee; Jennifer Dworak; Kenneth M. Butler; Bret Stewart; Hari Balachandran; Bryan Houchins; Vineet Mathur; Jaehong Park; Li-C. Wang; M. Ray Mercer (VTS, 1999)

Logic mapping on a microprocessor. - Anjali Kinra; Hari Balachandran; Regy Thomas; John Carulli (ITC, 2000)

Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. - Zoran Stanojevic; Hari Balachandran; D. M. H. Walker; Fred Lakbani; Jayashree Saxena; Kenneth M. Butler (ITC, 2000)

Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. - Sri Jandhyala; Hari Balachandran; Manidip Sengupta; Anura P. Jayasumana (VTS, 2000)

Facilitating Rapid First Silicon Debug. - Hari Balachandran; Kenneth M. Butler; Neil Simpson (ITC, 2002)

K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. - Wangqi Qiu; Jing Wang 006; D. M. H. Walker; Divya Reddy; Zhuo Li 001; Weiping Shi; Hari Balachandran (ITC, 2004)